Thermo Scientific™

Evolution™ 201/220 UV-Visible Spectrophotometers

Catalog number: 840-210800
Thermo Scientific™

Evolution™ 201/220 UV-Visible Spectrophotometers

Catalog number: 840-210800
New sales of this model have been discontinued. Please see the newest models: the Evolution One/One Plus Spectrophotometers.
 
Catalog Number
840-210800
Unit Size
Each
Product Line
Evolution 201
Type
Computer Control UV-Vis Spectrophotometer
Warranty
3 Years
Price (USD)
Availability
-
Full specifications
Quantity
-
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
Certifications/ComplianceISO 9001:2008
ConnectionsUSB or RS-232
DescriptionEvolution 201 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 201
Spectral Bandwidth1.0 nm
TypeComputer Control UV-Vis Spectrophotometer
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
HoldsCuvettes up to 100 mm
IncludesEU/US/UK power cords
Lamp Life7 years typical
Noise0A: <0.00015A;
1A:<0.00025A;
2A: <0.00080A;
260 nm, 1.0 nm SBW, RMS
Optical DesignDouble Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
Pharmacopoeia Compliance Testing
Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198 nm: KCI; ≤0.05%AT at 220 nm: Nal, Kl
Wavelength Accuracy: ±.5 nm 541.9, 546.1nm Hg emission lines, ±0.8 nm full range
Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorMicrosoft Windows 7, Windows 8
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wattage150 W max.
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (English)32 lb.
Weight (Metric)14.4 kg
Unit SizeEach
Catalog Number
Unit Size
Each
Product Line
Evolution 220
Type
Computer Control UV-Vis Spectrophotometer
Warranty
3 Years
Price (USD)
Price: 5,000.00
Your Price:
Availability
-
Full specifications
Quantity
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
DescriptionEvolution 220 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 220
Spectral BandwidthVariable: 1.0 nm, 2.0 nm
TypeComputer Control UV-Vis Spectrophotometer
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
IncludesEU/US/UK power cords
KeypadSealed membrane
Lamp Life7 years typical
Noise0A: <0.00015A;
1A: <0.00025A;
2A: <0.00080A;
260 nm, 1nm SBW, RMS
Optical DesignAFBG Microcell optimized, AFBG Fiber optic optimized, AFBG Materials optimized
Pharmacopoeia Compliance Testing(Guaranteed Performance Specifications)
Resolution (toluene in Hexane): ≥1.8A
Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198 nm: KCI; ≤ to 0.05 %AT at 220nm: Nal, Kl
Wavelength Accuracy: ±0.5 nm 541.9, 546.1 nm Hg emission lines, ±0.8 nm full range
Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1nm Hg emission line
Photometric Accuracy1 A: ±0.006A, 2 A: ±0.010 A, Measured at 440 nm
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorMicrosoft Windows 7, Windows 8
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.11 nm mercury line, SD of 10 measurements)
Weight (English)32 lb.
Weight (Metric)14.4 kg
Unit SizeEach
Catalog Number
Unit Size
Each
Product Line
Evolution 201
Type
Spectrophotometer plus Tablet Control Module - US, CAN, JP
Warranty
3 Years
Price (USD)
Availability
-
Full specifications
Quantity
-
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
Certifications/ComplianceISO 9001:2008
ConnectionsUSB or RS-232
Depth (English)24.3 in.
Depth (Metric)62.2 mm
DescriptionEvolution 201 Tablet Control Module US, CAN, JP
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 201
Spectral Bandwidth1.0 nm
TypeSpectrophotometer plus Tablet Control Module - US, CAN, JP
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
HoldsCuvettes up to 100 mm
KeypadSealed membrane
Lamp Life7 years typical
Noise0A: <0.00015A;
1A:<0.00025A;
2A: <0.00080A;
260nm, 1.0nm SBW, RMS
Optical DesignDouble Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
Pharmacopoeia Compliance TestingResolution (Toluene in Hexane): ≥1.8A
Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl
Wavelength Accuracy: ±.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range
Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorINSIGHT 2 Software is compatible with Windows™ 7 and Windows 8.1 Professional Editions
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wattage150 W max.
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (Metric)14.4 kg
Unit SizeEach
Catalog Number
Unit Size
Each
Product Line
Evolution 201
Type
Spectrophotometer plus Tablet Control Module - INTL
Warranty
3 Years
Price (USD)
Availability
-
Full specifications
Quantity
-
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
Certifications/ComplianceISO 9001:2008
ConnectionsUSB or RS-232
Depth (English)24.3 in.
Depth (Metric)62.2 mm
DescriptionEvolution 201 Spectrophotometer plus Tablet Control Module - International
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 201
Spectral Bandwidth1.0 nm
TypeSpectrophotometer plus Tablet Control Module - INTL
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
HoldsCuvettes up to 100 mm
KeypadSealed membrane
Lamp Life7 years typical
Noise0A: <0.00015A;
1A:<0.00025A;
2A: <0.00080A;
260nm, 1.0nm SBW, RMS
Optical DesignDouble Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
Pharmacopoeia Compliance TestingResolution (Toluene in Hexane): ≥1.8A
Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl
Wavelength Accuracy: ±.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range
Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line
Photometric Accuracy1 A: ±0.006A, 2 A: ±0.010 A, Measured at 440 nm
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorINSIGHT 2 Software is compatible with Windows™ 7 and Windows 8.1 Professional Editions
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wattage150 W max.
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (Metric)14.4 kg
Unit SizeEach
Catalog Number
Unit Size
Each
Product Line
Evolution 220
Type
Spectrophotometer plus Tablet Control Module - US, CAN, JP
Warranty
3 Years
Price (USD)
Availability
-
Full specifications
Quantity
-
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
DescriptionEvolution 220 Tablet Control Module US, CAN, JP
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 220
Spectral BandwidthVariable: 1.0 nm, 2.0 nm
TypeSpectrophotometer plus Tablet Control Module - US, CAN, JP
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
KeypadSealed membrane
Lamp Life7 years typical
Noise0A: <0.00015A;
1A: <0.00025A;
2A: <0.00080A;
260nm, 1nm SBW, RMS
Optical DesignAFBG Microcell optimized, AFBG Fiber optic optimized, AFBG Materials optimized
Pharmacopoeia Compliance Testing(Guaranteed Performance Specifications)
Resolution (toluene in Hexane): ≥1.8A
Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl
Wavelength Accuracy: ±0.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range
Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line
Photometric Accuracy1 A: ±0.006A, 2 A: ±0.010 A, Measured at 440 nm
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorMicrosoft Windows™ XP embedded. INSIGHT 2 Software is also compatible with Windows 7 and Windows 8.1 Professional Editions.
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.11 nm mercury line, SD of 10 measurements)
Weight (Metric)14.4 kg
Unit SizeEach
Catalog Number
Unit Size
Each
Product Line
Evolution 220
Type
Spectrophotometer plus Tablet Control Module - INTL
Warranty
3 Years
Price (USD)
Availability
-
Full specifications
Quantity
-
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
Certifications/ComplianceCertificate of Analysis (COA), Certificate of Conformance (COC)
DescriptionEvolution 220 Spectrophotometer plus Tablet Control Module - International
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 220
Spectral BandwidthVariable: 1.0 nm, 2.0 nm
TypeSpectrophotometer plus Tablet Control Module - INTL
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
For Use With (Application)Spectroscopy Elemental Isotope Analysis
KeypadSealed membrane
Lamp Life7 years typical
Noise0A: <0.00015A;
1A: <0.00025A;
2A: <0.00080A;
260nm, 1nm SBW, RMS
Optical DesignAFBG Microcell optimized, AFBG Fiber optic optimized, AFBG Materials optimized
Pharmacopoeia Compliance Testing(Guaranteed Performance Specifications)
Resolution (toluene in Hexane): ≥1.8A
Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl
Wavelength Accuracy: ±0.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range
Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line
Photometric Accuracy1 A: ±0.006A, 2 A: ±0.010 A, Measured at 440 nm
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorMicrosoft Windows™ XP embedded. INSIGHT 2 Software is also compatible with Windows 7 and Windows 8.1 Professional Editions.
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.11 nm mercury line, SD of 10 measurements)
Weight (Metric)14.4 kg
Unit SizeEach
Showing 6 of 6
Catalog NumberSpecificationsUnit SizeProduct LineTypeWarrantyPrice (USD)AvailabilityQuantity
840-210800Full specifications
EachEvolution 201Computer Control UV-Vis Spectrophotometer3 YearsRequest A Quote--
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
Certifications/ComplianceISO 9001:2008
ConnectionsUSB or RS-232
DescriptionEvolution 201 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 201
Spectral Bandwidth1.0 nm
TypeComputer Control UV-Vis Spectrophotometer
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
HoldsCuvettes up to 100 mm
IncludesEU/US/UK power cords
Lamp Life7 years typical
Noise0A: <0.00015A;
1A:<0.00025A;
2A: <0.00080A;
260 nm, 1.0 nm SBW, RMS
Optical DesignDouble Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
Pharmacopoeia Compliance Testing
Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198 nm: KCI; ≤0.05%AT at 220 nm: Nal, Kl
Wavelength Accuracy: ±.5 nm 541.9, 546.1nm Hg emission lines, ±0.8 nm full range
Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorMicrosoft Windows 7, Windows 8
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wattage150 W max.
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (English)32 lb.
Weight (Metric)14.4 kg
Unit SizeEach
840-210600Full specifications
EachEvolution 220Computer Control UV-Vis Spectrophotometer3 Years
Price: 5,000.00
Your Price:
-
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
DescriptionEvolution 220 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 220
Spectral BandwidthVariable: 1.0 nm, 2.0 nm
TypeComputer Control UV-Vis Spectrophotometer
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
IncludesEU/US/UK power cords
KeypadSealed membrane
Lamp Life7 years typical
Noise0A: <0.00015A;
1A: <0.00025A;
2A: <0.00080A;
260 nm, 1nm SBW, RMS
Optical DesignAFBG Microcell optimized, AFBG Fiber optic optimized, AFBG Materials optimized
Pharmacopoeia Compliance Testing(Guaranteed Performance Specifications)
Resolution (toluene in Hexane): ≥1.8A
Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198 nm: KCI; ≤ to 0.05 %AT at 220nm: Nal, Kl
Wavelength Accuracy: ±0.5 nm 541.9, 546.1 nm Hg emission lines, ±0.8 nm full range
Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1nm Hg emission line
Photometric Accuracy1 A: ±0.006A, 2 A: ±0.010 A, Measured at 440 nm
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorMicrosoft Windows 7, Windows 8
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.11 nm mercury line, SD of 10 measurements)
Weight (English)32 lb.
Weight (Metric)14.4 kg
Unit SizeEach
912A0883Full specifications
EachEvolution 201Spectrophotometer plus Tablet Control Module - US, CAN, JP3 YearsRequest A Quote--
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
Certifications/ComplianceISO 9001:2008
ConnectionsUSB or RS-232
Depth (English)24.3 in.
Depth (Metric)62.2 mm
DescriptionEvolution 201 Tablet Control Module US, CAN, JP
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 201
Spectral Bandwidth1.0 nm
TypeSpectrophotometer plus Tablet Control Module - US, CAN, JP
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
HoldsCuvettes up to 100 mm
KeypadSealed membrane
Lamp Life7 years typical
Noise0A: <0.00015A;
1A:<0.00025A;
2A: <0.00080A;
260nm, 1.0nm SBW, RMS
Optical DesignDouble Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
Pharmacopoeia Compliance TestingResolution (Toluene in Hexane): ≥1.8A
Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl
Wavelength Accuracy: ±.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range
Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorINSIGHT 2 Software is compatible with Windows™ 7 and Windows 8.1 Professional Editions
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wattage150 W max.
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (Metric)14.4 kg
Unit SizeEach
912A0890Full specifications
EachEvolution 201Spectrophotometer plus Tablet Control Module - INTL3 YearsRequest A Quote--
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
Certifications/ComplianceISO 9001:2008
ConnectionsUSB or RS-232
Depth (English)24.3 in.
Depth (Metric)62.2 mm
DescriptionEvolution 201 Spectrophotometer plus Tablet Control Module - International
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 201
Spectral Bandwidth1.0 nm
TypeSpectrophotometer plus Tablet Control Module - INTL
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
HoldsCuvettes up to 100 mm
KeypadSealed membrane
Lamp Life7 years typical
Noise0A: <0.00015A;
1A:<0.00025A;
2A: <0.00080A;
260nm, 1.0nm SBW, RMS
Optical DesignDouble Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
Pharmacopoeia Compliance TestingResolution (Toluene in Hexane): ≥1.8A
Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl
Wavelength Accuracy: ±.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range
Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line
Photometric Accuracy1 A: ±0.006A, 2 A: ±0.010 A, Measured at 440 nm
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorINSIGHT 2 Software is compatible with Windows™ 7 and Windows 8.1 Professional Editions
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wattage150 W max.
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (Metric)14.4 kg
Unit SizeEach
912A0884Full specifications
EachEvolution 220Spectrophotometer plus Tablet Control Module - US, CAN, JP3 YearsRequest A Quote--
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
DescriptionEvolution 220 Tablet Control Module US, CAN, JP
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 220
Spectral BandwidthVariable: 1.0 nm, 2.0 nm
TypeSpectrophotometer plus Tablet Control Module - US, CAN, JP
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
KeypadSealed membrane
Lamp Life7 years typical
Noise0A: <0.00015A;
1A: <0.00025A;
2A: <0.00080A;
260nm, 1nm SBW, RMS
Optical DesignAFBG Microcell optimized, AFBG Fiber optic optimized, AFBG Materials optimized
Pharmacopoeia Compliance Testing(Guaranteed Performance Specifications)
Resolution (toluene in Hexane): ≥1.8A
Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl
Wavelength Accuracy: ±0.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range
Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line
Photometric Accuracy1 A: ±0.006A, 2 A: ±0.010 A, Measured at 440 nm
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorMicrosoft Windows™ XP embedded. INSIGHT 2 Software is also compatible with Windows 7 and Windows 8.1 Professional Editions.
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.11 nm mercury line, SD of 10 measurements)
Weight (Metric)14.4 kg
Unit SizeEach
912A0889Full specifications
EachEvolution 220Spectrophotometer plus Tablet Control Module - INTL3 YearsRequest A Quote--
Baseline Flatness±0.0010 A, 200 to 800 nm, 1.0 nm SBW, smoothing
Certifications/ComplianceCertificate of Analysis (COA), Certificate of Conformance (COC)
DescriptionEvolution 220 Spectrophotometer plus Tablet Control Module - International
Detector TypeDual Silicon Photodiodes
DisplayNone
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in.)
Product LineEvolution 220
Spectral BandwidthVariable: 1.0 nm, 2.0 nm
TypeSpectrophotometer plus Tablet Control Module - INTL
Wavelength Range190 to 1100 nm
Drift<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz selected automatically, 150 W maximum
For Use With (Application)Spectroscopy Elemental Isotope Analysis
KeypadSealed membrane
Lamp Life7 years typical
Noise0A: <0.00015A;
1A: <0.00025A;
2A: <0.00080A;
260nm, 1nm SBW, RMS
Optical DesignAFBG Microcell optimized, AFBG Fiber optic optimized, AFBG Materials optimized
Pharmacopoeia Compliance Testing(Guaranteed Performance Specifications)
Resolution (toluene in Hexane): ≥1.8A
Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl
Wavelength Accuracy: ±0.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range
Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line
Photometric Accuracy1 A: ±0.006A, 2 A: ±0.010 A, Measured at 440 nm
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002 A
ProcessorMicrosoft Windows™ XP embedded. INSIGHT 2 Software is also compatible with Windows 7 and Windows 8.1 Professional Editions.
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Scan Speed<1 to 6000 nm/min. (Variable)
Warranty3 Years
Wavelength Accuracy±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability≤0.05 nm (546.11 nm mercury line, SD of 10 measurements)
Weight (Metric)14.4 kg
Unit SizeEach
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New sales of this model have been discontinued. Please see the newest models: the Evolution One/One Plus Spectrophotometers.