Thermo Scientific™

MK.2TE ESD and Latch-up Test System

Catalog number: CUSPID0000019
Thermo Scientific™

MK.2TE ESD and Latch-up Test System

Catalog number: CUSPID0000019
Catalog Number
CUSPID0000019
also known as CUS:PID0000019
Unit Size
Each
Price (USD)
Catalog NumberUnit SizePrice (USD)
CUSPID0000019
also known as CUS:PID0000019
EachRequest A Quote
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The Thermo Scientific™ MK.2TE ESD and Latch-up Test System provides users with advanced capabilities to test high pin count devices to today’s Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design ensures waveform hazards in the standards, such as the trailing pulse and the pre-discharge voltage rise, are addressed. Trailing pulses have been shown to cause non-ESD related failures by exposing the DUT to an electrical overstress after the main HBM event. Predischarge voltage can cause voltage-triggered protection structures to fail, as the pin under test may not be at zero volts when the HBM event occurs. A user-selectable 10K Shunt can be connected during the pulse to eliminate any voltage prior to the actual HBM event. The MK.2 combination test system also performs Latch-Up testing per the JEDEC EIA/JESD 78 Method. Its enhanced data set features provide the flexibility to meet the testing needs of today’s system-on-chip designs.

Specifications

Test Voltage Range
30 V to 2 kV (MM); 30 V to 8 kV (HBM)
Type
ESD Test System
Voltage
90/250 V
Description
MK.2TE ESD and Latch-up Test System
Size (English)
22.8 in W x 30.5 in D x 39 in H
Size (Metric)
57.9 cm W x 77.5 cm D x 99.1 cm H
Specifications Details
Configured as 128, 256, 384, 512 or 768 pins

Enhanced data set features: Report all data gathered for off-line reduction and analysis; core test data is readily available; highly repeatable, reproducible test data is stored in an easy-to-manipulate standard XML file structure