|Description||UniQuant Software for Standardless XRF Analysis|
|Item Description||UniQuant software; Configurable|
|Catalog Number||Specifications||Unit Size||Description||Price (USD)|
|IQLAAHGABUFABXMATU||Each||UniQuant Software for Standardless XRF Analysis||Request A Quote|
Sample preparation is usually minimal or not required.
Analyzes up to 79 elements from Boron to Americium or their oxide compounds.
For each analysed element, UniQuant reports the Standard Deviation (Sigma) in ppm.
Supports analysis of samples in variety of physical forms, including multi-element solids, pressed powder with binder, small samples on supporting film, liquids or filter aerosol samples, and others.
Reports in weight percentage along with an estimated error for each element with reliable results.
For trace analysis, corrects for background, spectral impurities, spectral line overlaps, matrix effects and certain physical effects.
At high power analyses are done in less than 14 minutes; samples belonging to a known family, requiring fewer measuring channels, may be analyzed in 5 minutes.
For specific applications where very high accuracy is required, UniQuant Software may use a specially-calibrated data set.
Thin Layer Samples