X-ray computed tomography (CT) is becoming an increasingly important tool for the non-destructive characterization of the three-dimensional microstructure of modern materials. The technique creates a three-dimensional representation of a material by reconstructing cross-sectional images or ‘slices’ taken through a sample.
Spiral (or helical) scanning, in which the X-ray source and detector are rotated around a sample, is standard practice in medical X-ray CT but less common in materials and geological science.
In this webinar the speakers will highlight the versatility of microCT by demonstrating the wide variety of materials that this system can characterize, from metals to polymers to biological samples.
The ease of use and high throughput of this system makes it ideal for investigations that need to identify a material’s internal structure (such as voids, cracks, solutes) non-destructively.
This webinar will:
Isabel Boona is a Scientist at Owens Corning – Corporate Analytical Laboratories. She holds BS and MS degrees in Materials Science and Engineering from Michigan State University. After graduating, she was a Research Scientist at The Ohio State University – Center for Electron Microscopy and Analysis (CEMAS) where she gained expertise in electron microscopy and X-ray microCT, including the novel sample preparation techniques required for the acquisition, reconstruction, and segmentation of complex three dimensional data sets.
Dirk Laeveren is Product Marketing Manager for micro-CT at Thermo Fisher Scientific. With a degree in engineering and marketing, he has vast experience and knowledge of microCT after a career working for various European and US companies involved in field imaging.