Analyzing and developing semiconductors requires multiple tools that deliver precise and repeatable results.  A full characterization of the material, meaning composition and thickness, coverage analysis and band gap measurements, can be done with just one highly sensitive instrument. The Thermo Scientific Nexsa Surface Analysis System has multiple techniques built right into the XPS instrument to deliver a complete picture of the material.  XPS can measure composition and thickness, while ISS can measure coverage and REELS can measure the band gap.

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Nexsa Surface Analysis System

Thermo Scientific Nexsa XPS

This multi-technique surface analysis system offers high throughput without sacrificing research grade results. Integrated techniques include ISS, UPS, REELS and Raman. 

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