Modern cutting-edge metals in the construction, transportation, and infrastructure industries are increasingly engineered at the nanoscale to enhance their durability, reliability, and cost. Even traditional processes are now augmented with microscopic inspection to determine the resulting material’s elemental and structural composition. Electron microscopy continues to evolve to meet the exacting needs of the metals industries that make analysis not only more informative but also far more rapid. Adding a Focused Ion Beam to a Scanning Electron Microscope takes failure analysis and interface characterization into the third dimension.
In this webinar, we will present a comprehensive introduction to FIB SEM applications in metals analysis given through examples from a variety of industries:
Herman Lemmens, Industrial Applications Manager