X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy provide chemical fingerprinting and structural information of 2D materials. The Thermo Scientific™ Nexsa™ Surface Analysis System eliminates sampling ambiguity by combining an XPS system with a Raman spectrometer to concurrently measure a material at the same point of analysis. This instrumentation has proven particularly useful in studying two-dimensional (2D) materials.
Download our application note “Multi-technique surface analysis for structural and chemical characterization of 2D materials” for a detailed look at an in-depth chemical and structural study of boron nitrate flakes on a copper substrate.
We demonstrate how the Thermo Scientific Nexsa XPS system: