Transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) tools continue to provide the most powerful high-resolution imaging and analysis of thin samples and are used in materials science research all over the world. STEM and TEM (S/TEM) technology has progressed dramatically in recent years. The latest, fully integrated hardware and software are enabling higher resolution and stability, even easier operation, less time on alignments, and better-quality imaging and EDX analysis.

Join our webinar and learn how those advancements in stability, software, detectors and automation can help you accomplish more with fast, precise, quantitative materials characterization in multiple dimensions, whatever your material.

Speaker biography

Yuri Rikers, Product Marketing Manager

Ir. Yuri G.M. Rikers studied Applied Physics at the Eindhoven University of Technology. He started working at Thermo Fisher Scientific in 2002 as a Service & Applications specialist TEM in the Technical Support Group. Since 2007, he has been working in the Thermo Fisher Scientific NanoPort in Eindhoven as Sr. Applications Specialist TEM, mainly supporting the Tecnai, Titan and Talos product series for the Materials Science Business Unit. In late 2015, Yuri started working as a Product Marketing Manager for the TEM division of the Materials Science Business Unit.

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